Investigating the Detachment of Glazed Ceramic Tiles Used in Buildings: A Brazilian Case Study
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Artigo
Date
2025
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Materials
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0
Authors
Sahade R.F.
Leal P.R.M.
Lima S.S.
da Silva P.S.
Lima C.R.C.
Leal P.R.M.
Lima S.S.
da Silva P.S.
Lima C.R.C.
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Abstract
© 2025 by the authors.Ceramic detachments in cladding systems are indicative of adhesion loss between the ceramic tiles and the substrate or its adhesive mortar due to inadequate quality workmanship, the quality of the adhesive mortar or that of the ceramic material, whether acting simultaneously or not. The shear stresses resulting from the ceramic tiles’ expansion due to humidity accelerate this process. There is a shortage of studies on the quality of ceramic tiles and adhesive mortars. This study conducted elemental, physical and microstructural characterization tests on ceramic tiles and adhesive mortars that showed detachment up to two years after being laid. At first glance, the adhesive mortar samples had adequate traits and degree of hydration. The ceramic tiles, on the other hand, showed high porosity and high levels of amorphous and poorly sintered materials, with no crystalline phase. In a second analysis, scanning electron microscopy (SEM) tests associated with boiling plus autoclave moisture expansion tests executed on unused ceramic pieces of the same conformation proved to be more suitable for predicting expansion potential than standard tests. Due to the costs and difficulties in accessing and analyzing the SEM tests, chemical analysis of the ceramic tiles was executed using X-ray fluorescence (XRF) to assess the presence of the amorphous silica (free quartz) and alkaline oxides. Together with pressure and temperature determination tests (autoclave), they may represent another alternative that is easier to access and more cost-effective for predicting future expansion.
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Keywords
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Adhesive mortar , Ceramic cladding , Ceramic tile , Detachment , Glazed ceramic tiles , In-buildings , Moisture expansion , Scanning electron microscopy tests , Scanning electrons , X ray fluorescence