A simple method for characterizing the dispersion of epsilon-near zero materials

dc.contributor.authorAlvarenga V.T.
dc.contributor.authorDe Matos C.J.S.
dc.date.accessioned2024-03-12T23:58:59Z
dc.date.available2024-03-12T23:58:59Z
dc.date.issued2018
dc.description.abstract© 2018 The Author (s).We determine the dielectric function spectrum of a material in the 0-1 range, by analyzing the reflectance spectrum as a function of incidence angle. Results obtained for silicon carbide closely match data from the literature.
dc.description.volumePart F123-LAOP 2018
dc.identifier.doi10.1364/LAOP.2018.Th4A.28
dc.identifier.issn2162-2701
dc.identifier.urihttps://dspace.mackenzie.br/handle/10899/35593
dc.relation.ispartofOptics InfoBase Conference Papers
dc.rightsAcesso Restrito
dc.titleA simple method for characterizing the dispersion of epsilon-near zero materials
dc.typeArtigo de evento
local.scopus.citations0
local.scopus.eid2-s2.0-85059456139
local.scopus.subjectDielectric function spectra
local.scopus.subjectEpsilon-near zeros
local.scopus.subjectIncidence angles
local.scopus.subjectReflectance spectrum
local.scopus.subjectSIMPLE method
local.scopus.updated2024-05-01
local.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85059456139&origin=inward
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