A simple method for characterizing the dispersion of epsilon-near zero materials
dc.contributor.author | Alvarenga V.T. | |
dc.contributor.author | De Matos C.J.S. | |
dc.date.accessioned | 2024-03-12T23:58:59Z | |
dc.date.available | 2024-03-12T23:58:59Z | |
dc.date.issued | 2018 | |
dc.description.abstract | © 2018 The Author (s).We determine the dielectric function spectrum of a material in the 0-1 range, by analyzing the reflectance spectrum as a function of incidence angle. Results obtained for silicon carbide closely match data from the literature. | |
dc.description.volume | Part F123-LAOP 2018 | |
dc.identifier.doi | 10.1364/LAOP.2018.Th4A.28 | |
dc.identifier.issn | 2162-2701 | |
dc.identifier.uri | https://dspace.mackenzie.br/handle/10899/35593 | |
dc.relation.ispartof | Optics InfoBase Conference Papers | |
dc.rights | Acesso Restrito | |
dc.title | A simple method for characterizing the dispersion of epsilon-near zero materials | |
dc.type | Artigo de evento | |
local.scopus.citations | 0 | |
local.scopus.eid | 2-s2.0-85059456139 | |
local.scopus.subject | Dielectric function spectra | |
local.scopus.subject | Epsilon-near zeros | |
local.scopus.subject | Incidence angles | |
local.scopus.subject | Reflectance spectrum | |
local.scopus.subject | SIMPLE method | |
local.scopus.updated | 2024-05-01 | |
local.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85059456139&origin=inward |